Multi-Variate Diagnostics, Monitoring and Control

CenterPoint’s products employ highly sophisticated methodologies for multi-variate diagnostics, monitoring and control.

The integrated diagnostics algorithms provide engineers with an immediate overview of the dependenciesbetweenhundreds of parameters.

Graphical views and editors guide engineers intuitively to problem-specific correlation models and models for health monitoring (FDC – fault detection and classification) and control.

Based on a few selected value-tuples, high-performance algorithms calculate the complete set of matching class candidates in real time. In a matter of a few minutes, complex classification scenarios can be defined for immediate use in automated scenarios.

Multi-variate diagnostics are integrated within an expert system framework. This allows very fast definition of application specific, automated decision making based on custom rules and control actions.

Pattern recognition on wafer test results is integrated to facilitate the automated recognition of critical fail test patterns such as scratches, clouds or any shape taught to the system by the product engineers. The recognition of patterns can trigger any configured action plan.

Instead of single equipment solutions requiring high maintenance effort per equipment hardware, CenterPoint’s products overcome this ineffectiveness via their factory-wide scaleable service oriented architecture (SOA). Based on this scaleable architecture, it is possible to set up high-performance diagnostics, monitoring and control scenarios able to handle up to 100,000 data points per second on a single service