Integrating Engineering and Mass Production
The powerful integration of diagnostics with the process engineer’s model definition process, and the application of the resultant process results during mass production lead to the faster ramp-up of new products and yield savings.
Critical to ensuring yield and wafer throughput are the fast detection of impact on yield and the immediate appropriate adaptation of the monitoring, classification and control models for the manufacturing process. Further benefits are reduced consumption of manufacturing resources and improvement in the effectiveness of the equipment.
The increasing need for manufacturing flexibility (increasing product mix) can only be mastered through further advances in meeting this vertical integration challenge.
CenterPoint provides a general off-the-shelf platform supporting factory-wide monitoring, defect classification and control applications (mass production). Based on the same platform, CenterPoint also provides diagnostics and model definition capabilities for the whole manufacturing process, including the integration of all front-end and final test data (engineering).
The new SEMI EDA standards are seamlessly integrated within the solution. Engineers can flexibly and easily define the most appropriate data collection plans (DCPs) as integrated components in their models, ensuring the highest sampling rates and data quality.
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